Invention Application
- Patent Title: SURVEY COVERAGE PARAMETERS
- Patent Title (中): 调查范围参数
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Application No.: US14594952Application Date: 2015-01-12
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Publication No.: US20160202377A1Publication Date: 2016-07-14
- Inventor: Bengt Boberg , Sverre Olsen , Christian Strand
- Applicant: PGS Geophysical AS
- Main IPC: G01V1/38
- IPC: G01V1/38 ; G01V1/28 ; G01V1/18

Abstract:
Techniques are disclosed relating to geophysical surveying. In some embodiments, an added unique fold parameter is determined for one or more bins during a survey of a geophysical formation. In some embodiments, the position of one or more elements of a survey system is adjusted based on the added unique fold. In some embodiments, a ratio of the determined added unique fold to a theoretically obtainable added unique fold is determined, and the adjustment may be based on this ratio. In some embodiments, an acceptability parameter is also considered. In some embodiments, survey elements may be steered to increase added unique fold without leaving coverage holes that violate an acceptability criterion. In some embodiments, the steering is performed automatically. In some embodiments, coverage parameters are graphically displayed to an operator.
Public/Granted literature
- US09903969B2 Survey coverage parameters Public/Granted day:2018-02-27
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