Invention Application
- Patent Title: I-V MEASUREMENT SYSTEM FOR PHOTOVOLTAIC MODULES
- Patent Title (中): 用于光伏模块的I-V测量系统
-
Application No.: US15077087Application Date: 2016-03-22
-
Publication No.: US20160204737A1Publication Date: 2016-07-14
- Inventor: Michael Gostein , Russell Apfel , Lawrence R. Dunn , Stan Faullin , Naoum Gitnik , Jason Schneider
- Applicant: ATONOMETRICS, INC.
- Applicant Address: US TX Austin
- Assignee: ATONOMETRICS, INC.
- Current Assignee: ATONOMETRICS, INC.
- Current Assignee Address: US TX Austin
- Main IPC: H02S50/00
- IPC: H02S50/00 ; G01R15/14

Abstract:
An apparatus for measuring electrical characteristics of solar panels (photovoltaic modules) wherein the apparatus measures current versus voltage (“I-V”) relationships for both illuminated (“light I-V”) and/or non-illuminated (“dark I-V”) conditions; optionally provides single, dual, or four-quadrant source/sink capability; and measures one or more devices under test (DUTs). The apparatus comprises one or more source measurement units (SMUs), wherein each SMU is connected to one DUT, and optionally includes a positive high-voltage programmable power supply and/or a negative high-voltage programmable power supply. Additionally, the apparatus includes a controller which controls the functions of the SMUs, the high-voltage supplies, and other components of the apparatus, wherein the controller communicates with the SMUs over a signal bus. Finally, the apparatus may include a computer to provide a user interface, communicate with the controller to initiate measurements and record results, analyze resulting data to determine measured parameters, and/or store the measured data.
Information query