Invention Application
US20160205575A1 METHOD FOR MAKING QUALITY MEASUREMENT REPORT BY TERMINAL AND TERMINAL USING SAME 审中-公开
通过端子和端子进行质量测量报告的方法

  • Patent Title: METHOD FOR MAKING QUALITY MEASUREMENT REPORT BY TERMINAL AND TERMINAL USING SAME
  • Patent Title (中): 通过端子和端子进行质量测量报告的方法
  • Application No.: US14911874
    Application Date: 2014-08-18
  • Publication No.: US20160205575A1
    Publication Date: 2016-07-14
  • Inventor: Sunghoon JUNGYoungdae LEE
  • Applicant: LG ELECTRONICS INC.
  • International Application: PCT/KR2014/007611 WO 20140818
  • Main IPC: H04W24/10
  • IPC: H04W24/10 H04W24/02
METHOD FOR MAKING QUALITY MEASUREMENT REPORT BY TERMINAL AND TERMINAL USING SAME
Abstract:
Provided are a method for making a quality measurement report by a terminal in which a plurality of serving cells in the same frequency band are configured, and a terminal using the method. The method comprises the steps of: receiving measurement configuration information; performing quality measurements on some or all of the plurality of serving cells according to the measurement configuration information; determining whether a measurement report criterion is met on the basis of a result of the quality measurement; and transmitting a report message including the result of the quality measurement when the measurement report criterion is met, wherein the measurement configuration information contains reference information, and the reference information indicates a reference cell by which it is determined whether the measurement report criterion is met.
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