A system and method for measuring properties of a sample utilizing a variable integrated computation element (ICE) formed of one or more layers of film that is physically sensitive to an electrical field or a magnetic field applied through the material. The thickness of a layer, and hence the optical properties of the ICE, can be electrically or magnetically altered to adjust the ICE for a analysis of a particular property of the sample, or to calibrate the ICE or to adjust the ICE to compensate for alterations to the ICE resulting from environmental conditions. The film may be formed of electrostrictive materials, piezoelectric materials, magnetorestrictive materials, and/or piezomagnetic materials.