Invention Application
- Patent Title: LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
- Patent Title (中): LITHOGRAPHIC装置和装置制造方法
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Application No.: US15027986Application Date: 2014-10-22
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Publication No.: US20160238953A1Publication Date: 2016-08-18
- Inventor: Hans BUTLER , Cornelius Adrianus Lambertus DE HOON , Marc Wilhelmus Maria VAN DER WIJST , Thijs VERHEES , Sander KERSSEMAKERS
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- International Application: PCT/EP2014/072590 WO 20141022
- Main IPC: G03F7/20
- IPC: G03F7/20

Abstract:
A lithographic apparatus includes a base frame, an illumination system configured to condition a radiation beam and supported by the base frame, a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, a projection system configured to project the patterned radiation beam onto a target portion of the substrate, a positioning device configured to position the substrate table, the positioning device being supported by the base frame, a sensor configured to sense a vibration caused by a torque exerted on the base frame, and an actuator configured to exert a force on the illumination system or the base frame, in response to the sensed vibration, in order to at least partly dampen the vibration.
Public/Granted literature
- US10409175B2 Lithographic apparatus and device manufacturing method Public/Granted day:2019-09-10
Information query
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