Invention Application
US20160245842A1 MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT SYSTEM
审中-公开
测量装置，测量方法和测量系统
- Patent Title: MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT SYSTEM
- Patent Title (中): 测量装置，测量方法和测量系统
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Application No.: US15048406Application Date: 2016-02-19
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Publication No.: US20160245842A1Publication Date: 2016-08-25
- Inventor: Yasushi YOSHIKAWA , Yoshihiro KOBAYASHI
- Applicant: Seiko Epson Corporation
- Priority: JP2015-031760 20150220
- Main IPC: G01P15/18
- IPC: G01P15/18
Abstract:
A measurement apparatus includes an acceleration sensor that detects values of acceleration in a plurality of directions; a calculation unit that calculates a predetermined physical quantity based on the values of the acceleration in the plurality of directions; an output unit that outputs data; and a selection unit that selects data to be output from the output unit, from among the values of the acceleration in the plurality of directions and the predetermined physical quantity.
Information query
