发明申请
- 专利标题： High-G Shock Testing Machine
- 专利标题（中）： 高G冲击试验机
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申请号： US15058057申请日： 2016-03-01
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公开(公告)号： US20160258837A1公开(公告)日： 2016-09-08
- 发明人: Jahangir S Rastegar , Jacques Fischer , Dake Feng
- 申请人： Jahangir S Rastegar , Jacques Fischer , Dake Feng
- 申请人地址： US NY Ronkonkoma
- 专利权人： Omnitek Partners LLC
- 当前专利权人： Omnitek Partners LLC
- 当前专利权人地址： US NY Ronkonkoma
- 主分类号： G01M7/08
- IPC分类号： G01M7/08 ; G01N3/307
摘要：
A shock testing machine including: a test platform upon which one or more objects to be tested are mounted; one or more rails upon which the test platform is movable in a longitudinal direction; and a braking station for retarding a relative motion between the test platform and the braking station, wherein the test platform and the braking station include at least one portion interfering with the relative motion of the test platform and the braking station such that relative movement of the test platform and the braking station past the at least one portion produces a shock lateral to the longitudinal direction.
公开/授权文献
- US10190937B2 High-G shock testing machine 公开/授权日：2019-01-29
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