Invention Application
US20160267054A1 METHOD FOR DETERMINING OPTIMUM REFERENCE DATA NUMBER FOR SMOOTHING MEASURED DATA AND METHOD FOR CORRECTING MEASURED DATA
审中-公开
用于确定用于平滑测量数据的最佳参考数据编号的方法和校正测量数据的方法
- Patent Title: METHOD FOR DETERMINING OPTIMUM REFERENCE DATA NUMBER FOR SMOOTHING MEASURED DATA AND METHOD FOR CORRECTING MEASURED DATA
- Patent Title (中): 用于确定用于平滑测量数据的最佳参考数据编号的方法和校正测量数据的方法
-
Application No.: US15066447Application Date: 2016-03-10
-
Publication No.: US20160267054A1Publication Date: 2016-09-15
- Inventor: Sung Kyu KIM , Yongjoon KWON
- Applicant: Korea Institute of Science and Technology
- Applicant Address: KR Seoul
- Assignee: Korea Institute of Science and Technology
- Current Assignee: Korea Institute of Science and Technology
- Current Assignee Address: KR Seoul
- Priority: KR10-2015-0033146 20150310
- Main IPC: G06F17/17
- IPC: G06F17/17 ; G01J1/44
Abstract:
Disclosed is a method for determining an optimum reference data number, which includes: smoothing measured data on the basis of different data numbers; obtaining a deviation of measured data before the smoothing and the smoothed measured data; and determining an optimum reference data number on the basis of the deviation. Also, disclosed is a method for correcting measured data, which includes: obtaining deviations of measured data and smoothed data obtained by smoothing the measured data; obtaining a reference deviation on the basis of the deviations; and correcting the measured data on the basis of the reference deviation.
Information query
