Invention Application
US20160269656A1 FLICKER DETECTION USING SEMICONDUCTOR LIGHT SOURCE 有权
使用半导体光源进行闪光检测

  • Patent Title: FLICKER DETECTION USING SEMICONDUCTOR LIGHT SOURCE
  • Patent Title (中): 使用半导体光源进行闪光检测
  • Application No.: US14827141
    Application Date: 2015-08-14
  • Publication No.: US20160269656A1
    Publication Date: 2016-09-15
  • Inventor: Douglas K. TaoAnup K. Sharma
  • Applicant: Apple Inc.
  • Applicant Address: US CA Cupertino
  • Assignee: APPLE INC.
  • Current Assignee: APPLE INC.
  • Current Assignee Address: US CA Cupertino
  • Main IPC: H04N5/353
  • IPC: H04N5/353 H04N5/235
FLICKER DETECTION USING SEMICONDUCTOR LIGHT SOURCE
Abstract:
Devices and methods for adjusting an exposure window of a rolling shutter based on a frequency determined from ambient light gathered by a bimodal component are disclosed. Flickering light sources may cause artifacts in captured images, due to interplay between a period of a frequency of ambient light and the exposure window. An image capture device includes a semiconductor component configured to operate in two modes and an exposure window control component configured to compensate for the flickering based on a signal from the light source. In a sensor mode, the semiconductor component may operate to detect the frequency of ambient light. To avoid image artifacts, the frequency of the ambient light is analyzed and an exposure time is adjusted to an integer multiple of the period of the frequency such that exposure is matched to the periodic illumination of the flickering light source.
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