发明申请
US20160271424A1 CHARGED PARTICLE STATE DETERMINATION APPARATUS AND METHOD OF USE THEREOF
审中-公开
充电颗粒状态测定装置及其使用方法
- 专利标题: CHARGED PARTICLE STATE DETERMINATION APPARATUS AND METHOD OF USE THEREOF
- 专利标题(中): 充电颗粒状态测定装置及其使用方法
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申请号: US15167617申请日: 2016-05-27
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公开(公告)号: US20160271424A1公开(公告)日: 2016-09-22
- 发明人: W. Davis Lee , Stephen L. Spotts , Susan L. Michaud
- 申请人: W. Davis Lee , Stephen L. Spotts , Susan L. Michaud
- 主分类号: A61N5/10
- IPC分类号: A61N5/10
摘要:
The invention comprises a system for determining the state of a charged particle beam, such as beam position, intensity, and/or energy. For example, the charged particle beam state is determined at or about a patient undergoing charged particle cancer therapy using one or more film layers designed to emit photons upon passage of a charged particle beam, which yields information on position and/or intensity of the charged particle beam. The emitted photons are used to calculate position of the treatment beam in imaging and/or during tumor treatment. Optionally and preferably, updating a tomography map uses the same hardware with the same alignment used for cancer therapy at proximately the same time.
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