Invention Application
US20160274097A1 SAMPLE ANALYSIS SYSTEMS AND METHODS 审中-公开
样本分析系统和方法

  • Patent Title: SAMPLE ANALYSIS SYSTEMS AND METHODS
  • Patent Title (中): 样本分析系统和方法
  • Application No.: US15073518
    Application Date: 2016-03-17
  • Publication No.: US20160274097A1
    Publication Date: 2016-09-22
  • Inventor: Jan zur Megede
  • Applicant: Bio-Rad Laboratories, Inc,
  • Main IPC: G01N33/543
  • IPC: G01N33/543
SAMPLE ANALYSIS SYSTEMS AND METHODS
Abstract:
Sample analysis systems and methods are provided. In one embodiment, the method may be achieved by applying a substance to a surface of a substrate having a first binding agent immobilized thereon; removing unbound material from at least a portion of the substrate having the substance applied thereon; applying a second binding agent to the surface of the substrate, wherein the second binding agent is optically labeled or unlabeled; removing unbound material from at least a portion of the substrate having the second binding agent applied thereon; responsive to detecting the optically labeled second binding agent bound to the substance, identifying the analyte present in the sample; and responsive to not detecting the optically labeled second binding agent bound to the substance, determining that the analyte is absent in the sample; wherein the applying the substance or second binding agent to the surface of the substrate steps are concurrent with the respective removing unbound material from at least a portion of the substrate steps. Systems and other methods are also described and illustrated.
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