Invention Application
- Patent Title: SAMPLE ANALYSIS SYSTEMS AND METHODS
- Patent Title (中): 样本分析系统和方法
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Application No.: US15073518Application Date: 2016-03-17
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Publication No.: US20160274097A1Publication Date: 2016-09-22
- Inventor: Jan zur Megede
- Applicant: Bio-Rad Laboratories, Inc,
- Main IPC: G01N33/543
- IPC: G01N33/543

Abstract:
Sample analysis systems and methods are provided. In one embodiment, the method may be achieved by applying a substance to a surface of a substrate having a first binding agent immobilized thereon; removing unbound material from at least a portion of the substrate having the substance applied thereon; applying a second binding agent to the surface of the substrate, wherein the second binding agent is optically labeled or unlabeled; removing unbound material from at least a portion of the substrate having the second binding agent applied thereon; responsive to detecting the optically labeled second binding agent bound to the substance, identifying the analyte present in the sample; and responsive to not detecting the optically labeled second binding agent bound to the substance, determining that the analyte is absent in the sample; wherein the applying the substance or second binding agent to the surface of the substrate steps are concurrent with the respective removing unbound material from at least a portion of the substrate steps. Systems and other methods are also described and illustrated.
Public/Granted literature
- US10048256B2 Sample analysis systems and methods Public/Granted day:2018-08-14
Information query
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