- 专利标题: LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
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申请号: US15167357申请日: 2016-05-27
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公开(公告)号: US20160274473A1公开(公告)日: 2016-09-22
- 发明人: Christiaan Alexander HOOGENDAM , Antonius Theodorus Anna Maria Derksen , Sjoerd Nicolaas Lambertus Donders , Joeri Lof , Erik Roelof Loopstra , Johannes Catharinus Hubertus Mulkens , Hans Jansen , Jacobus Johannus Leonardus Hendricus Verspay , Alexander Straaijer , Bob Streefkerk
- 申请人: Christiaan Alexander HOOGENDAM , Antonius Theodorus Anna Maria Derksen , Sjoerd Nicolaas Lambertus Donders , Joeri Lof , Erik Roelof Loopstra , Johannes Catharinus Hubertus Mulkens , Hans Jansen , Jacobus Johannus Leonardus Hendricus Verspay , Alexander Straaijer , Bob Streefkerk
- 申请人地址: NL Veldhoven
- 专利权人: ASML NETHERLANDS B.V.
- 当前专利权人: ASML NETHERLANDS B.V.
- 当前专利权人地址: NL Veldhoven
- 优先权: EP02257822.3 20021112; EP03253636.9 20030609; EP03254059.3 20030626
- 主分类号: G03F7/20
- IPC分类号: G03F7/20
摘要:
A lithographic projection apparatus includes a support structure configured to hold a patterning device, the patterning device configured to pattern a beam of radiation according to a desired pattern; a substrate table configured to hold a substrate; a projection system configured to project the patterned beam onto a target portion of the substrate; a liquid supply system configured to provide liquid to a space between the projection system and the substrate; and a shutter configured to isolate the space from the substrate or a space to be occupied by a substrate.
公开/授权文献
- US09588442B2 Lithographic apparatus and device manufacturing method 公开/授权日:2017-03-07
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