Invention Application
- Patent Title: Quality Factor Estimation for Resonators
- Patent Title (中): 谐振器质量因子估计
-
Application No.: US15092943Application Date: 2016-04-07
-
Publication No.: US20160298963A1Publication Date: 2016-10-13
- Inventor: Ronald Alan Kapusta , Jiefeng Yan , James Lin
- Applicant: Analog Devices, Inc.
- Main IPC: G01C19/56
- IPC: G01C19/56 ; G01C25/00

Abstract:
Various embodiments provide methods of determining the quality factor of a resonating body in ways that are advantageous over previously known methods. For example, embodiments allow the determination of the quality factors of a resonating body without preventing the simultaneous use of the resonating body. For micromachined (“MEMS”) devices, embodiments allow the determination of the quality factors of a resonating body in a manner that is not dependent on transduction parameters of the MEMS device.
Public/Granted literature
- US10309782B2 Quality factor estimation for resonators Public/Granted day:2019-06-04
Information query