发明申请
US20160327432A1 SYSTEM FOR DETECTION AND IMAGING BY SPECTRAL ANALYSIS IN SEVERAL WAVELENGTH BANDS
有权
通过在几个波长范围内的光谱分析进行检测和成像的系统
- 专利标题: SYSTEM FOR DETECTION AND IMAGING BY SPECTRAL ANALYSIS IN SEVERAL WAVELENGTH BANDS
- 专利标题(中): 通过在几个波长范围内的光谱分析进行检测和成像的系统
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申请号: US14778494申请日: 2014-03-19
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公开(公告)号: US20160327432A1公开(公告)日: 2016-11-10
- 发明人: FRANCOIS DUFRESNE DE VIREL , MARC BOUSQUET
- 申请人: SAGEM DEFENSE SECURITE
- 优先权: FR1352458 20130319
- 国际申请: PCT/EP2014/055538 WO 20140319
- 主分类号: G01J3/36
- IPC分类号: G01J3/36 ; G01S3/784 ; G01J1/04
摘要:
The invention relates to a system for detection and infrared imaging by spectral analysis in several wavelength bands comprising: —an imaging sensor comprising a plurality of elementary sensors together forming a matrix sensitive surface; —an imaging optic adapted for forming on the sensitive surface of the imaging sensor, a first image of the scene to be analysed in a first wavelength band, and at least one second image of the scene to be analysed in a second wavelength band, characterized in that said detection and imaging system furthermore comprises an optical device consisting of a fixed optical plate adapted for shifting the first image with respect to the second image in the plane of the sensitive surface, the shift between the images being along a direction defined by a row, a column or a diagonal of elementary sensors, the shift distance being equal to the spacing of the elementary sensors of the matrix sensitive surface along this direction or to a multiple of this spacing.
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