Disclosed is an inspection apparatus for inspecting a chip for noise, including an inspection circuit that is connected to a first power line of the chip and that receives a signal to be inspected, wherein the first voltage is applied to the first power line and the signal to be inspected includes noise having a second voltage, and a voltage doubler that is connected to the first power line and boosts a voltage of driving power having the first voltage, wherein the inspection circuit may be driven by the driving power, the voltage of the driving power is boosted by the voltage doubler, and the inspection circuit inspects the chip for the noise of the signal to be inspected.