Invention Application
- Patent Title: TECHNOLOGIES FOR PAN TILT UNIT CALIBRATION
- Patent Title (中): PAN TILT UNIT校准技术
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Application No.: US14755476Application Date: 2015-06-30
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Publication No.: US20170006209A1Publication Date: 2017-01-05
- Inventor: Remus Boca , Jianjun Wang , Thomas Fuhlbrigge , Biao Zhang
- Applicant: ABB Technology Ltd.
- Main IPC: H04N5/232
- IPC: H04N5/232 ; H04N17/00 ; B25J9/16 ; G06T7/60 ; G06K9/52 ; G06T7/20 ; H04N7/18 ; G06T7/00

Abstract:
Technologies for calibrating a pan tilt unit with a robot include a robot controller to move a camera of the pan tilt unit about a first rotational axis of the pan tilt unit to at least three different first axis positions. The robot controller records a first set of positions of a monitored component of the robot in a frame of reference of the robot and a position of the camera in a frame of reference of the pan tilt unit during a period in which the monitored component is within a field of view of the camera for each of the at least three different first axis positions. Further, the robot controller moves the camera about a second rotational axis of the pan tilt unit to at least three different second axis positions and records a second set of positions of the monitored component in the frame of reference of the robot and a position of the camera in the frame of reference of the pan tilt unit during a period in which the monitored component is within a field of view of the camera for each of the at least three different second axis positions. Further, the robot controller determines a transformation from the frame of reference of the robot to the frame of reference of the pan tilt unit based on the first set of recorded positions and the second set of recorded positions.
Public/Granted literature
- US09807292B2 Technologies for pan tilt unit calibration Public/Granted day:2017-10-31
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