Invention Application
- Patent Title: MEASUREMENT SYSTEM OF REAL-TIME SPATIALLY-RESOLVED SPECTRUM AND TIME-RESOLVED SPECTRUM AND MEASUREMENT MODULE THEREOF
- Patent Title (中): 实时空间分辨率和时间分辨率的测量系统及其测量模块
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Application No.: US14825252Application Date: 2015-08-13
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Publication No.: US20170016769A1Publication Date: 2017-01-19
- Inventor: Ming-Hsien CHOU , Jian-Long XIAO , Ya-Wen CHUANG , Jyh-Rou SZE , Po-Jui CHEN , Chun-Fu LIN , Long-Jeng LEE , Chun-Li CHANG , Chi Hung HUANG , Da-Ren LIU
- Applicant: HC PHOTONICS CORP.
- Assignee: HC PHOTONICS CORP.
- Current Assignee: HC PHOTONICS CORP.
- Priority: TW104122825 20150714
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/64

Abstract:
The present invention provides a measurement system of real-time spatially-resolved spectrum and time-resolved spectrum and a measurement module thereof. The measurement system includes an excitation light and a measurement module. The excitation light excites a fluorescent sample and the measurement module receives and analyzes fluorescence emitted by the fluorescent sample. The measurement module includes a single-photon linear scanner and a linear CCD spectrometer. The single-photon linear scanner selectively intercepts a light beam component of a multi-wavelength light beam that has a predetermined wavelength to generate a single-wavelength time-resolved signal, wherein the multi-wavelength light beam is generated by splitting the fluorescence. The linear CCD spectrometer receives the multi-wavelength light beam and generates a spatially-resolved full-spectrum fluorescence signal. With the implementation of the present invention, the spatially-resolved full-spectrum fluorescence signal and the single-wavelength time-resolved signal can be observed at the same time. Thus, the facility of a fluorescence spectrometer is improved.
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