发明申请
US20170024238A1 Apparatus for Hardware Accelerated Runtime Integrity Measurement
审中-公开
硬件加速运行时完整性测量装置
- 专利标题: Apparatus for Hardware Accelerated Runtime Integrity Measurement
- 专利标题(中): 硬件加速运行时完整性测量装置
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申请号: US15175874申请日: 2016-06-07
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公开(公告)号: US20170024238A1公开(公告)日: 2017-01-26
- 发明人: Radhakrishna RK Hiremane , Anil S. Keshavamurthy
- 申请人: Intel Corporation
- 主分类号: G06F9/455
- IPC分类号: G06F9/455 ; G06F3/06
摘要:
Techniques are described for providing processor-based dedicated fixed function hardware to perform runtime integrity measurements for detecting attacks on system supervisory software, such as a hypervisor or native Operating System (OS). The dedicated fixed function hardware is provided with memory addresses of the system supervisory software for monitoring. After obtaining the memory addresses and other information required to facilitate integrity monitoring, the dedicated fixed function hardware activates a lock-out to prevent reception of any additional information, such as information from a corrupted version of the system supervisory software. The dedicated fixed function hardware then automatically performs periodic integrity measurements of the system supervisory software. Upon detection of an integrity failure, the dedicated fixed function hardware uses out-of-band signaling to report that an integrity failure has occurred.The dedicated fixed function hardware provides for runtime integrity verification of a platform in a secure manner without impacting the performance of the platform.
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