发明申请
- 专利标题: ABSOLUTE DISTANCE MEASUREMENT APPARATUS AND METHOD USING LASER INTERFEROMETRIC WAVELENGTH LEVERAGE
- 专利标题(中): 绝对距离测量装置和使用激光干涉波长角度的方法
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申请号: US15304062申请日: 2015-03-27
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公开(公告)号: US20170038192A1公开(公告)日: 2017-02-09
- 发明人: Benyong CHEN , Liping YAN , Shihua ZHANG
- 申请人: ZHEJIANG SCI-TECH UNIVERSITY
- 申请人地址: CN Zhejiang
- 专利权人: ZHEJIANG SCI-TECH UNIVERSITY
- 当前专利权人: ZHEJIANG SCI-TECH UNIVERSITY
- 当前专利权人地址: CN Zhejiang
- 国际申请: PCT/CN2015/075187 WO 20150327
- 主分类号: G01B11/14
- IPC分类号: G01B11/14
摘要:
An absolute distance measurement apparatus and method using laser interferometric wavelength leverage includes a light source system, a wavelength-leverage laser interferometric system and an interference signal processing and controlling system. The light source system outputs a orthogonally linearly polarized beam with the wavelength λ1 and the wavelength λ2. The orthogonally linearly polarized beam projects onto the wavelength-leverage laser interferometric system to form the interference beam. The interference beam projects onto the interference signal processing and controlling system. In the wavelength-leverage laser interferometric system, the synthetic wavelength and the single wavelength as well as the measured absolute distance and the moving displacement of the cube-corner prism in the reference arm form a wavelength-leverage absolute distance measurement relationship.