Invention Application
- Patent Title: ANALYSIS SYSTEM, ANALYSIS PROGRAM, AND ANALYSIS METHOD
- Patent Title (中): 分析系统,分析程序和分析方法
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Application No.: US15106858Application Date: 2014-12-18
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Publication No.: US20170039713A1Publication Date: 2017-02-09
- Inventor: SHIORI OSHIMA , ERIKO MATSUI
- Applicant: SONY CORPORATION
- Priority: JP2014-000843 20140107
- International Application: PCT/JP2014/006327 WO 20141218
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G02B21/00 ; G06T7/20

Abstract:
[Object] To provide an analysis system, an analysis program, and an analysis method suited for analyzing a 3-dimensional temporal state of an observation object.[Solving Means] An analysis system according to the present technique includes a feature amount calculation section and a reference position calculation section. The feature amount calculation section calculates a feature amount in each of a plurality of moving images of a sample including an observation object, that have been captured at different focal positions, the plurality of moving images having the same phase of movements. The reference position calculation section calculates a reference position of the observation object in a focus direction based on the feature amount.
Public/Granted literature
- US10535137B2 Analysis system and analysis method Public/Granted day:2020-01-14
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