Invention Application
US20170039713A1 ANALYSIS SYSTEM, ANALYSIS PROGRAM, AND ANALYSIS METHOD 审中-公开
分析系统,分析程序和分析方法

  • Patent Title: ANALYSIS SYSTEM, ANALYSIS PROGRAM, AND ANALYSIS METHOD
  • Patent Title (中): 分析系统,分析程序和分析方法
  • Application No.: US15106858
    Application Date: 2014-12-18
  • Publication No.: US20170039713A1
    Publication Date: 2017-02-09
  • Inventor: SHIORI OSHIMAERIKO MATSUI
  • Applicant: SONY CORPORATION
  • Priority: JP2014-000843 20140107
  • International Application: PCT/JP2014/006327 WO 20141218
  • Main IPC: G06T7/00
  • IPC: G06T7/00 G02B21/00 G06T7/20
ANALYSIS SYSTEM, ANALYSIS PROGRAM, AND ANALYSIS METHOD
Abstract:
[Object] To provide an analysis system, an analysis program, and an analysis method suited for analyzing a 3-dimensional temporal state of an observation object.[Solving Means] An analysis system according to the present technique includes a feature amount calculation section and a reference position calculation section. The feature amount calculation section calculates a feature amount in each of a plurality of moving images of a sample including an observation object, that have been captured at different focal positions, the plurality of moving images having the same phase of movements. The reference position calculation section calculates a reference position of the observation object in a focus direction based on the feature amount.
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