Invention Application
- Patent Title: SCANNING MICROSCOPE
- Patent Title (中): 扫描显微镜
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Application No.: US15230213Application Date: 2016-08-05
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Publication No.: US20170059840A1Publication Date: 2017-03-02
- Inventor: Shingo TAMANO
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: JP2015-167266 20150826
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B27/00 ; G02B21/02
Abstract:
A scanning microscope includes: a varifocal lens that scans an object in an optical-axis direction of an objective; a scanner that scans the object in a direction orthogonal to the optical axis of the objective; and a controller configured to control the varifocal lens and the scanner.
Public/Granted literature
- US10107999B2 Scanning microscope Public/Granted day:2018-10-23
Information query
