Invention Application
US20170063091A1 APPARATUS AND METHOD OF MEASURING DATA IN HIGH VOLTAGE DIRECT CURRENT SYSTEM
审中-公开
在高电压直流电流系统中测量数据的装置和方法
- Patent Title: APPARATUS AND METHOD OF MEASURING DATA IN HIGH VOLTAGE DIRECT CURRENT SYSTEM
- Patent Title (中): 在高电压直流电流系统中测量数据的装置和方法
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Application No.: US15066228Application Date: 2016-03-10
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Publication No.: US20170063091A1Publication Date: 2017-03-02
- Inventor: Eun Jae LEE
- Applicant: LSIS CO., LTD.
- Applicant Address: KR Anyang-si
- Assignee: LSIS CO., LTD.
- Current Assignee: LSIS CO., LTD.
- Current Assignee Address: KR Anyang-si
- Priority: KR10-2015-0121142 20150827
- Main IPC: H02J3/36
- IPC: H02J3/36 ; H02M5/40 ; G01R21/133
Abstract:
A data measurement device in a high voltage direct current (HVDC) system is provided. The data measurement device includes: a power measurement unit measuring pieces of power related data; and a control unit determining measurement times at which the pieces of power related data are measured respectively, and performing control based on pieces of power related data having a same measurement time among the pieces of power related data.
Public/Granted literature
- US10305284B2 Apparatus and method of measuring data in high voltage direct current system Public/Granted day:2019-05-28
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