Invention Application
- Patent Title: NON-CONTACT VOLTAGE MEASUREMENT DEVICE
- Patent Title (中): 非接触式电压测量装置
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Application No.: US15122545Application Date: 2015-02-04
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Publication No.: US20170067939A1Publication Date: 2017-03-09
- Inventor: Hiroshi IMAI , Keiki MATSUURA , Hiroyuki TOKUSAKI , Mao OGIMOTO , Goro KAWAKAMI , Kohei TOMITA , Atsuhiro OKAMURA
- Applicant: OMRON CORPORATION
- Applicant Address: JP Kyoto-shi, KYOTO
- Assignee: OMRON CORPORATION
- Current Assignee: OMRON CORPORATION
- Current Assignee Address: JP Kyoto-shi, KYOTO
- Priority: JP2014-050654 20140313
- International Application: PCT/JP2015/053148 WO 20150204
- Main IPC: G01R15/16
- IPC: G01R15/16

Abstract:
Provided is a non-contact voltage measuring device capable of measuring, with given accuracy, measurement target voltages applied to various conducting wires having respective different shapes. An inner electrode which is deformable depending on a shape of a wire “w” is electrically connected, via a connecting section, to an outer electrode fixed to an electric field shield.
Public/Granted literature
- US10145865B2 Non-contact voltage measurement device Public/Granted day:2018-12-04
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