Invention Application
US20170069000A1 QUALITY VISIT MEASURE FOR CONTROLLING COMPUTER RESPONSE TO QUERY ASSOCIATED WITH PHYSICAL LOCATION 审中-公开
质量访问控制计算机对物理位置相关查询的响应

  • Patent Title: QUALITY VISIT MEASURE FOR CONTROLLING COMPUTER RESPONSE TO QUERY ASSOCIATED WITH PHYSICAL LOCATION
  • Patent Title (中): 质量访问控制计算机对物理位置相关查询的响应
  • Application No.: US14849368
    Application Date: 2015-09-09
  • Publication No.: US20170069000A1
    Publication Date: 2017-03-09
  • Inventor: Krzysztof Duleba
  • Applicant: Google Inc.
  • Main IPC: G06Q30/02
  • IPC: G06Q30/02 G06F17/30
QUALITY VISIT MEASURE FOR CONTROLLING COMPUTER RESPONSE TO QUERY ASSOCIATED WITH PHYSICAL LOCATION
Abstract:
The response of a computer to a query associated with a physical location may be controlled using a quality visit measure that is based at least in part on the number and/or frequency of repeat visits by one or more individuals to that physical location.
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