Invention Application
- Patent Title: FINFET DEVICE AND FABRICATING METHOD THEREOF
- Patent Title (中): FINFET器件及其制造方法
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Application No.: US14994057Application Date: 2016-01-12
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Publication No.: US20170069757A1Publication Date: 2017-03-09
- Inventor: Yen-Ming Peng , Chi-Wen Liu , Hsin-Chieh Huang , Yi-Ju Hsu , Horng-Huei Tseng
- Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L29/66 ; H01L29/49 ; H01L29/423

Abstract:
A FinFET device includes a substrate, a fin formed on the substrate, and a gate electrode crossing the fin. The gate electrode includes a head portion and a tail portion, and the tail portion is connected to the head portion and extended toward the substrate. The width of the head portion is greater than that of the tail portion.
Public/Granted literature
- US10164059B2 FinFET device and fabricating method thereof Public/Granted day:2018-12-25
Information query
IPC分类: