Invention Application
- Patent Title: MEASUREMENT INSTRUMENT, MEASUREMENT METHOD, MEASUREMENT SYSTEM, AND PROGRAM
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Application No.: US15272775Application Date: 2016-09-22
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Publication No.: US20170097277A1Publication Date: 2017-04-06
- Inventor: Yoshihiro KOBAYASHI
- Applicant: Seiko Epson Corporation
- Priority: JP2015-196614 20151002; JP2015-196615 20151002
- Main IPC: G01M5/00
- IPC: G01M5/00

Abstract:
An acquisition unit acquires the width-direction acceleration and the vertical-direction acceleration of a surface of a structure on which a moving object moves from an acceleration sensor provided in the structure on which the moving object moves. A displacement computation unit computes the vertical-direction displacement of the structure on the basis of the vertical-direction acceleration. A correlation determination unit determines the correlation between the width-direction acceleration and the vertical-direction displacement. A movement detection unit detects the movement of the moving object on the structure on the basis of the correlation.
Public/Granted literature
- US10203350B2 Measurement instrument, measurement method, measurement system, and program Public/Granted day:2019-02-12
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