• Patent Title: MEASUREMENT INSTRUMENT, MEASUREMENT METHOD, MEASUREMENT SYSTEM, AND PROGRAM
  • Application No.: US15272775
    Application Date: 2016-09-22
  • Publication No.: US20170097277A1
    Publication Date: 2017-04-06
  • Inventor: Yoshihiro KOBAYASHI
  • Applicant: Seiko Epson Corporation
  • Priority: JP2015-196614 20151002; JP2015-196615 20151002
  • Main IPC: G01M5/00
  • IPC: G01M5/00
MEASUREMENT INSTRUMENT, MEASUREMENT METHOD, MEASUREMENT SYSTEM, AND PROGRAM
Abstract:
An acquisition unit acquires the width-direction acceleration and the vertical-direction acceleration of a surface of a structure on which a moving object moves from an acceleration sensor provided in the structure on which the moving object moves. A displacement computation unit computes the vertical-direction displacement of the structure on the basis of the vertical-direction acceleration. A correlation determination unit determines the correlation between the width-direction acceleration and the vertical-direction displacement. A movement detection unit detects the movement of the moving object on the structure on the basis of the correlation.
Information query
Patent Agency Ranking
0/0