发明申请
- 专利标题: PROBE PIN
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申请号: US15317200申请日: 2015-06-04
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公开(公告)号: US20170115324A1公开(公告)日: 2017-04-27
- 发明人: Hirotada TERANISHI , Takahiro SAKAI
- 申请人: OMRON Corporation
- 申请人地址: JP Kyoto-shi, KYOTO
- 专利权人: OMRON Corporation
- 当前专利权人: OMRON Corporation
- 当前专利权人地址: JP Kyoto-shi, KYOTO
- 优先权: JP2014-123529 20140616
- 国际申请: PCT/JP2015/066222 WO 20150604
- 主分类号: G01R1/067
- IPC分类号: G01R1/067
摘要:
A probe pin includes a coil spring, a first plunger, a first end of which is inserted from a first end of the coil spring into the coil spring and a second end of which is exposed to outside of the coil spring, and a second plunger, a first end of which is inserted from a second end of the coil spring into the coil spring to be in contact with the first end of the first plunger and a second end of which is exposed to the outside of the coil spring. The second plunger includes at least one elastic arm extending from the second end of the second plunger, and a touch portion is provided at a leading end of the elastic arm and displaceable in a direction intersecting an axial center direction when pressing force in the axial center direction is applied to the touch portion.
公开/授权文献
- US10145862B2 Probe pin 公开/授权日:2018-12-04
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