发明申请
- 专利标题: ALIGNMENT MARKERS TO FACILITATE DETECTION OF OBJECT ORIENTATION AND DEFORMATION
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申请号: US14926006申请日: 2015-10-29
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公开(公告)号: US20170124367A1公开(公告)日: 2017-05-04
- 发明人: Mordehai Margalit , Youval Nehmadi
- 申请人: EMPIRE TECHNOLOGY DEVELOPMENT LLC
- 主分类号: G06K7/10
- IPC分类号: G06K7/10 ; G06K9/62 ; G06K7/14
摘要:
Technologies are generally described for use of orientation markers to determine object orientation and/or deformation. In some examples, an orientation marker for a physical object may include an alignment structure and encode information about the alignment structure. For example, the orientation marker may encode the size of the alignment structure, the orientation of the alignment structure, and the location of the alignment structure with respect to some physical point on the physical object and/or other orientation markers on the physical object An orientation system may then use the encoded information to determine the orientation and/or alignment of the object. The orientation system may also use the encoded information to determine whether the physical object is deformed.
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