- 专利标题: SAMPLE TUBE RACK AND SAMPLE TUBE ANALYSING SYSTEM
-
申请号: US15352473申请日: 2016-11-15
-
公开(公告)号: US20170136467A1公开(公告)日: 2017-05-18
- 发明人: Charles W. Johns , Thomas Krafczyk
- 申请人: Beckman Coulter, Inc.
- 优先权: EP15003260.5 20151116
- 主分类号: B01L9/06
- IPC分类号: B01L9/06 ; G01N35/00 ; G01N35/04 ; G01N35/02
摘要:
A sample tube rack for receiving at least one sample tube comprises an upper part comprising an upper surface, wherein at least one upper opening for receiving the sample tube is provided in the upper surface; an intermediate part comprising an intermediate surface, wherein at least one intermediate opening for receiving the sample tube is provided in the intermediate surface; and a lower part comprising a supporting surface, wherein at least one supporting position for supporting the sample tube is provided in the supporting surface. Therein, the intermediate part is connected to both the upper part and the lower part such that the at least one upper opening is substantially aligned above the at least one intermediate opening and above the at least one supporting position for receiving the at least one sample tube. At least one gripping orifice is provided in a lateral side of the lower part.
公开/授权文献
- US10919043B2 Sample tube rack and sample tube analysing system 公开/授权日:2021-02-16