- 专利标题: TESTING DEVICE FOR LASER ILLUMINATION SYSTEMS
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申请号: US14975889申请日: 2015-12-21
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公开(公告)号: US20170176249A1公开(公告)日: 2017-06-22
- 发明人: Florian R. Fournier , Miodrag Scepanovic
- 申请人: APPLE INC.
- 主分类号: G01J1/42
- IPC分类号: G01J1/42 ; G02B5/02 ; G02B27/42
摘要:
Apparatus and methods are described, including an apparatus for testing a light beam emitted by a light source. The apparatus includes a transparent substrate, a first face of the substrate being shaped to define a plurality of optical deflectors. At least one optical detector is positioned to face a second face of the substrate that is not opposite the first face. Each one of the deflectors is configured to deflect a portion of the light beam toward the detector, when the light beam is passed through the first face of the substrate. Other applications are also described.
公开/授权文献
- US10145730B2 Testing device for laser illumination systems 公开/授权日:2018-12-04
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