Invention Application
- Patent Title: Index Image Quality Metric
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Application No.: US14975655Application Date: 2015-12-18
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Publication No.: US20170178058A1Publication Date: 2017-06-22
- Inventor: Srikrishna Bhat , Sri Kaushik Pavani , Anshul Garg
- Applicant: Srikrishna Bhat , Sri Kaushik Pavani , Anshul Garg
- Applicant Address: JP Tokyo
- Assignee: Ricoh Co., Ltd.
- Current Assignee: Ricoh Co., Ltd.
- Current Assignee Address: JP Tokyo
- Main IPC: G06Q10/08
- IPC: G06Q10/08 ; G06T7/20

Abstract:
A system and method that computes a quality score for an index image is disclosed. The method includes receiving an index image, computing a blurriness score of the index image based on variance associated with the index image, computing an image resolution score of the index image based on an area of the index image and a threshold area, computing a feature spread score for the index image using a first plurality of features associated with the index image, computing a feature uniqueness score for the index image using a description associated with each of a second plurality of features and determining a quality score for the index image using the blurriness score, the image resolution score, the feature spread score, and the feature uniqueness score.
Public/Granted literature
- US09754237B2 Index image quality metric Public/Granted day:2017-09-05
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