- 专利标题: METHODS AND APPARATUSES FOR TEST AND CANCELLATION OF RESIDUAL IMAGE
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申请号: US15306532申请日: 2016-01-12
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公开(公告)号: US20170178553A1公开(公告)日: 2017-06-22
- 发明人: Hao Zhang , Wei Sun , Lingyun Shi , Haiwei Sun
- 申请人: Boe Technology Group Co., Ltd. , Beijing Boe Optoelectronics Technology Co., Ltd.
- 申请人地址: CN Beijing
- 专利权人: BOE Technology Group Co., Ltd.
- 当前专利权人: BOE Technology Group Co., Ltd.
- 当前专利权人地址: CN Beijing
- 优先权: CN201510450701.X 20150728
- 国际申请: PCT/CN2016/070670 WO 20160112
- 主分类号: G09G3/00
- IPC分类号: G09G3/00 ; G09G3/36
摘要:
The embodiments of the present disclosure provide a method and an apparatus for test and cancellation of residual image, capable of solving the problem associated with inaccurate evaluation of residual image and difficulty in accurate modification. The method for residual image test according to the present disclosure comprises: playing a residual image test picture on a display panel; applying a first fixed level signal to a pixel electrode of the display panel; and obtaining potential information of the pixel electrode via a data line.
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