Invention Application
- Patent Title: SPATIAL ANALYSIS WITH ATTRIBUTE GRAPHS
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Application No.: US15500916Application Date: 2014-07-31
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Publication No.: US20170220902A1Publication Date: 2017-08-03
- Inventor: Nathan Moroney , Jun Zeng
- Applicant: Hewlett-Packard Development Company, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- International Application: PCT/US2014/049146 WO 20140731
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06K9/46

Abstract:
Examples relate to providing spatial analysis using attribute graphs. In one examples, there are a number of spatial points that each represent characteristics in a dimensional space. Non-data points are generated in the dimensional space, and a Delaunay triangulation is performed using the spatial points and the non-data points to generate a plurality of edges, where interior points of the plurality of non-data points that are in an interior space of the plurality of spatial points are excluded from the Delaunay triangulation. Next, spatial edges from the plurality of edges that each connect a spatial point that is connected to a first mixed edge to another spatial point that is connected to a second mixed edge are identified, where the spatial edges are used to generate a robust contour of a cluster of the spatial points.
Public/Granted literature
- US10152653B2 Spatial analysis with attribute graphs Public/Granted day:2018-12-11
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