Invention Application
- Patent Title: SEMICONDUCTOR DEVICE
-
Application No.: US15469721Application Date: 2017-03-27
-
Publication No.: US20170263609A1Publication Date: 2017-09-14
- Inventor: Masami ENDO
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2013-169830 20130819
- Main IPC: H01L27/105
- IPC: H01L27/105 ; H01L29/786 ; H01L27/12

Abstract:
To provide a semiconductor device with excellent charge retention characteristics, an OS transistor is used as a transistor whose gate is connected to a node for retaining charge. Charge is stored in a first capacitor, and data at the node for retaining charge is read based on whether the stored charge is transferred to a second capacitor. Since a Si transistor, in which leakage current through a gate insulating film occurs, is not used as a transistor connected to the node for retaining charge, charge retention characteristics of the node are improved. In addition, the semiconductor device operates in data reading without requiring transistor performance equivalent to that of a Si transistor.
Information query
IPC分类: