A temperature measurement system includes at least one temperature measurement probe. The at least one temperature measurement probe includes at least one hollow filament configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one hollow filament. The at least one hollow filament has a first diameter and a first emissivity. The at least one temperature measurement probe also includes at least one thin filament extending within at least a portion of the at least one hollow filament. The at least one thin filament is configured to emit thermal radiation in a predetermined and substantially continuous wavelength band at least partially representative of a temperature of the at least one thin filament. The at least one thin filament has a second emissivity and a second diameter less than the first diameter.