- 专利标题: YIELD MONITORING APPARATUS, SYSTEMS, AND METHODS
-
申请号: US15631931申请日: 2017-06-23
-
公开(公告)号: US20170292867A1公开(公告)日: 2017-10-12
- 发明人: Justin Koch , Michael Strnad
- 申请人: Precision Planting LLC
- 主分类号: G01F15/12
- IPC分类号: G01F15/12 ; A01D61/04 ; G01F3/00 ; A01D41/127
摘要:
Apparatus, systems and methods are provided for monitoring yield while harvesting grain. Grain released from paddles on the clean grain elevator chain of a harvester contacts a flow sensor which reports the rate of grain flow through the clean grain elevator. In some embodiments a brush is mounted to the chain and disposed to clean the flow sensor surface. In other embodiments a bucket mounted to the clean grain elevator chain releases grain against the flow sensor at a rate dependent on a grain property.
公开/授权文献
- US09989395B2 Yield monitoring apparatus, systems, and methods 公开/授权日:2018-06-05
信息查询