Described herein is a system. The system comprises an output cabling comprising an output wire and a return wire. The system also comprises a surge generator configured to provide a voltage pulse at a first rise time down the output cabling to a device under test. The output wire causes a ring at an initiation of the voltage pulse being provided by the surge generator to the device under test. The return wire is a return leg of the output cabling that is in a parallel path to the output wire and is configured to reduce or eliminate the ring.