Invention Application
- Patent Title: DEPOSITING APPARATUS AND METHOD FOR MEASURING DEPOSITION QUANTITY USING THE SAME
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Application No.: US15651425Application Date: 2017-07-17
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Publication No.: US20170312773A1Publication Date: 2017-11-02
- Inventor: Sung-Joong JOO , You-Min Cha , Seuk-Hwan Park
- Applicant: Samsung Display Co., Ltd.
- Priority: KR10-2012-0084201 20120731
- Main IPC: B05B12/00
- IPC: B05B12/00 ; C23C14/54 ; C23C14/04

Abstract:
A deposition apparatus uniformly controlling deposited quantities of a plurality of depositing sources by efficiently determining an abnormal depositing source. The deposition apparatus may reduce loss of materials by exactly determining an abnormal depositing source. The deposition apparatus includes: a plurality of depositing sources spraying a deposition material; a substrate holder fixing a substrate to face the depositing source; a depositing source shutter disposed at one side of the depositing source and opening and closing an passage of each depositing source; and a main shutter disposed between the depositing source and the substrate fixed to the substrate holder and depositing a part of the deposition material on the substrate through the main shutter.
Public/Granted literature
- US10596582B2 Depositing apparatus and method for measuring deposition quantity using the same Public/Granted day:2020-03-24
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