Invention Application
- Patent Title: TEMPERATURE INSENSITIVE DELAY LINE INTERFEROMETER
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Application No.: US15148710Application Date: 2016-05-06
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Publication No.: US20170324482A1Publication Date: 2017-11-09
- Inventor: Masaki KATO , Radhakrishnan L. NAGARAJAN
- Applicant: INPHI CORPORATION
- Main IPC: H04B10/67
- IPC: H04B10/67 ; H04J14/02 ; H04B10/69

Abstract:
A silicon photonics based temperature-insensitive delay line interferometer (DLI). The DLI includes a first arm comprising a first length of a first material characterized by a first group index corresponding to a first phase delay to transfer a first light wave with a first peak frequency and a second arm comprising a second length of a second material characterized by a second group index corresponding to a second phase to transfer a second light wave with a second peak frequency with a time-delay difference relative to the first light wave. The first phase delay and the second phase delay are configured to change equally upon a change of temperature. The time-delay difference between the first light wave and the second light wave is set to be inversed value of a free spectral range (FSR) to align at least the first peak frequency to a channel of a designated frequency grid.
Public/Granted literature
- US09929814B2 Temperature insensitive delay line interferometer Public/Granted day:2018-03-27
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