Invention Application
- Patent Title: DISTANCE SENSOR, AND CALIBRATION METHOD PERFORMED BY DEVICE AND SYSTEM INCLUDING THE DISTANCE SENSOR
-
Application No.: US15592584Application Date: 2017-05-11
-
Publication No.: US20170328992A1Publication Date: 2017-11-16
- Inventor: A-ron BAIK , Jung-gap KUK , Chang-soo PARK , Seung-beom HAN , Mid-eum CHOI , Jung-un LEE
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2017-0016851 20170207
- Main IPC: G01S7/497
- IPC: G01S7/497 ; G01S17/93 ; G01S17/42

Abstract:
A calibration method performed by a distance sensor emitting at least one beam is provided. The calibration method includes obtaining information regarding one surface of an object; obtaining distance sensor data by emitting a plurality of beams to the one surface of the object; and performing calibration on the plurality of beams emitted by the distance sensor, based on the information about the one surface of the object and the distance sensor data.
Public/Granted literature
- US10539664B2 Distance sensor, and calibration method performed by device and system including the distance sensor Public/Granted day:2020-01-21
Information query