- 专利标题: Concurrent Transformer Test System and Method
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申请号: US15714384申请日: 2017-09-25
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公开(公告)号: US20180011131A1公开(公告)日: 2018-01-11
- 发明人: David Hembree Milner , John Leonard Shanks , Harvey Wayne Veselka, JR.
- 申请人: AVO Multi-Amp Corporation d/b/a Megger
- 主分类号: G01R29/20
- IPC分类号: G01R29/20 ; G01R31/02 ; H01H9/00
摘要:
A tester for testing a transformer is provided. The tester comprises a primary voltmeter and a plurality of secondary voltmeters. The tester may also comprise an ammeter in series with a voltage source configured to apply voltage to the transformer. The primary voltmeter is configured to measure voltage induced across a primary winding of the transformer, while the secondary voltmeters may simultaneously measure voltage outputs at secondary windings of the transformer. The tester is configured to calculate ratios, saturation curves, and knee points for multiple winding combinations based on the measurements simultaneously obtained by the ammeter and the primary and secondary voltmeters.
公开/授权文献
- US10527662B2 Concurrent transformer test system and method 公开/授权日:2020-01-07
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