Invention Application
- Patent Title: SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
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Application No.: US15697513Application Date: 2017-09-07
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Publication No.: US20180013005A1Publication Date: 2018-01-11
- Inventor: Shunpei YAMAZAKI , Haruyuki BABA , Akio SUZUKI , Hiromi SAWAI , Masahiko HAYAKAWA , Noritaka ISHIHARA , Masashi OOTA
- Applicant: Semiconductor Energy Laboratory Co., Ltd.
- Priority: JP2014-242856 20141201; JP2015-047546 20150310; JP2015-118401 20150611; JP2015-126832 20150624
- Main IPC: H01L29/786
- IPC: H01L29/786 ; H01L29/04 ; H01L29/66 ; H01L21/02 ; H01L29/24 ; H01L21/203

Abstract:
After a sputtering gas is supplied to a deposition chamber, plasma including an ion of the sputtering gas is generated in the vicinity of a target. The ion of the sputtering gas is accelerated and collides with the target, so that flat-plate particles and atoms of the target are separated from the target. The flat-plate particles are deposited with a gap therebetween so that the flat plane faces a substrate. The atom and the aggregate of the atoms separated from the target enter the gap between the deposited flat-plate particles and grow in the plane direction of the substrate to fill the gap. A film is formed over the substrate. After the deposition, heat treatment is performed at high temperature in an oxygen atmosphere, which forms an oxide with a few oxygen vacancies and high crystallinity.
Public/Granted literature
- US10084096B2 Semiconductor device and method of manufacturing the same Public/Granted day:2018-09-25
Information query
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