- 专利标题: COUNTER COUNTERFEIT TECHNOLOGY
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申请号: US15218490申请日: 2016-07-25
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公开(公告)号: US20180022144A1公开(公告)日: 2018-01-25
- 发明人: Gerald P. Uyeno
- 申请人: Raytheon Company
- 主分类号: B42D25/328
- IPC分类号: B42D25/328 ; B42D25/382 ; B42D25/387 ; G06K19/16 ; G01N21/552 ; G01N21/65 ; H01L23/544 ; G06K7/10 ; B42D25/21 ; B42D25/445
摘要:
An identification patch having a plasmonic resonance structure may be used to ensure that an article is counterfeit-proof. The identification patch may be formed by a printing process, such as roll-to-roll printing or nanoimprinting, to create a distinctive ordered pattern of resonance elements. When the plasmonic resonance structure is irradiated, the ordered pattern of resonance elements produces a unique spectral response that is associated only with the counterfeit-proof article. The counterfeit-proof article may be a metal component or an integrated circuit. The resonant absorption of the plasmonic resonance structure may be measured to verify the authenticity of the article before use of the article.
公开/授权文献
- US09931882B2 Counter counterfeit technology 公开/授权日:2018-04-03
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