Invention Application
- Patent Title: Method For Calibrating At Least One Processing Element
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Application No.: US15549356Application Date: 2016-02-08
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Publication No.: US20180024013A1Publication Date: 2018-01-25
- Inventor: Martin Kammerl , Konrad Senn
- Applicant: KRONES AG
- Priority: DE102015101769.5 20150206
- International Application: PCT/EP2016/052627 WO 20160208
- Main IPC: G01K15/00
- IPC: G01K15/00

Abstract:
Provided is a method for calibrating at least one processing element, in a processing station for processing plastic preforms, includes providing: a first measurement preform establishing at least one first measurement value of the measurement preform before processing by the processing station, and a second measurement value of the measurement preform is measured by the measuring element or a further measuring element before or after processing by the processing station, and using at least these two measurement values, a mathematical temperature curve, is recorded by the measuring element, wherein at least one calibration device determines a deviation of the measured temperature curve from a mathematical standard temperature curve, and eliminates this deviation at least partially by adaptation of processing parameters of the processing station.
Public/Granted literature
- US10393596B2 Method for calibrating at least one processing element Public/Granted day:2019-08-27
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