Invention Application
- Patent Title: IC STRUCTURE INTEGRITY SENSOR HAVING INTERDIGITATED CONDUCTIVE ELEMENTS
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Application No.: US15237066Application Date: 2016-08-15
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Publication No.: US20180047648A1Publication Date: 2018-02-15
- Inventor: Zhuojie Wu , Erdem Kaltalioglu
- Applicant: GLOBALFOUNDRIES Inc.
- Main IPC: H01L21/66
- IPC: H01L21/66

Abstract:
A sensor for an integrated circuit (IC) structure is disclosed. The sensor includes a sensor layer in a layer of the IC structure, the sensor layer including: a first conductive structure disposed proximate a perimeter of the IC structure; and a second conductive structure disposed parallel to the first conductive structure and proximate the perimeter of the IC structure. The sensor also includes a set of interdigitating conductive elements including a first plurality of conductive elements electrically coupled to the first conductive structure interdigitating with a second plurality of conductive elements electrically coupled to the second conductive structure.
Public/Granted literature
- US09947602B2 IC structure integrity sensor having interdigitated conductive elements Public/Granted day:2018-04-17
Information query
IPC分类: