Invention Application
- Patent Title: OPTICAL MEASUREMENT METHOD AND OPTICAL MEASUREMENT APPARATUS
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Application No.: US15677606Application Date: 2017-08-15
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Publication No.: US20180073923A1Publication Date: 2018-03-15
- Inventor: Nobuyuki INOUE , Taku NAGASHIMA
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Priority: JP2016-176777 20160909
- Main IPC: G01J3/02
- IPC: G01J3/02 ; G01N21/359

Abstract:
There is provided an optical measurement method using a detector having a detection sensitivity to at least a near-infrared region. The optical measurement method including: obtaining an output value by measuring a light sample at any exposure time with the detector; and correcting the output value with an amount of correction corresponding to the output value, when the exposure time at which the output value is obtained is within a second range. The amount of correction includes a product of a coefficient and a square of the exposure time, the coefficient indicating a degree to which an output value obtained when the light sample is measured with the detector at an exposure time within the second range deviates from output linearity obtained when the light sample is measured with the detector at an exposure time within a first range.
Public/Granted literature
- US10429238B2 Optical measurement method and optical measurement apparatus Public/Granted day:2019-10-01
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