Invention Application
- Patent Title: BACK-SIDE FRICTION REDUCTION OF A SUBSTRATE
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Application No.: US15826091Application Date: 2017-11-29
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Publication No.: US20180082833A1Publication Date: 2018-03-22
- Inventor: Hoyoung Kang
- Applicant: Tokyo Electron Limited
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/027 ; G03F7/20 ; G03F7/26

Abstract:
A processing chamber system includes a substrate mounting module configured to secure a substrate within a first processing chamber. The system also includes a first deposition module configured to apply a light-sensitive film to a front side surface of the substrate, and a second deposition module configured to apply a film layer to a backside surface of the substrate. The front side surface is opposite to the backside surface of the substrate. A substrate has a bare backside surface with a first coefficient of friction. A film layer is formed onto the backside surface of the substrate. The film layer formed on the backside surface of the substrate has a second coefficient of friction. The second coefficient of friction is lower than the first coefficient of friction.
Information query
IPC分类: