METHOD AND DEVICE FOR MEASURING A LONG PROFILE
摘要:
The invention relates to a method for measuring a long profile (2), in particular one at an increased temperature, wherein a cross-section of the long profile (2) is determined, wherein the long profile (2) is measured using a light section sensor (4) that is moveably mounted on a swivel device (3). The invention also relates to a device for measuring a long profile (2), in particular one at an increased temperature, comprising a measuring device for determining a cross-section of the long profile (2), wherein a swivel device (3) is provided and the measuring device is formed as a light section sensor (4), wherein the light section sensor (4) is moveably mounted on the swivel device (3). The invention further relates to a use of a device (1) of this type.
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