The present technology relates an inspection apparatus, an inspection method and a program by which accurate measurement light correction can be performed.The inspection apparatus calculates a correction gain of a spectrum based on reference spectral information, under a reference light source, of a reference reflector plate having a characteristic according to an inspection object and measurement spectral information of the reference reflector plate obtained by sensing under a measurement light source, and corrects measurement spectral information of the inspection object obtained by the sensing under the measurement light source based on the calculated correction gain. The present technology can be applied, for example, to a vegetation inspection apparatus that measures a vegetation index of a normalized vegetation index (NDVI) or the like.