Embodiments may relate to an embedded package having a diffusion barrier layer may be placed between a copper (Cu) pad and a solder ball inside the embedded package. During the solder reflow process, an intermetallic compound (IMC) layer is created that does not come into contact with the Cu, so that subsequent high temperatures applied to the embedded package may not cause the Cu to be consumed through diffusion. Other embodiments may be described and/or claimed.